授课教师：许团辉

教师简介（中英文）：

许团辉，2010年毕业于中国电子科技集团计算机体系结构专业。2011年加入深圳海思半导体部门，长期从事芯片DFT技术研究，主要研究方向为Memory测试算法开发，测试电路设计和失效诊断。

Xu Tuanhui, graduated from China Electronics Technology Group in 2010 with a major in computer architecture. Joined Shenzhen Hisilicon Semiconductor Department in 2011 and has been engaged in the research of chip DFT technology for a long time. The main research direction is the development of Memory test algorithm, test circuit design and failure diagnosis.

课程简介（中英文）：

本课程主要介绍数字集成芯片在开发，生产制造和测试方面的主要工作和面临的挑战。通过该课程使学生可以了解到芯片设计存在哪些技术领域，以及各个领域需要具备哪些知识域，为有志从事芯片开发相关工作的同学提供指引。

This course mainly introduces the main work and challenges faced in the development, manufacturing and testing of digital integrated chips. Through this course, students can understand what technical fields exist in chip design, and what knowledge domains are required in each field, and provide guidance for students who are interested in chip development related work.