Hits:
Affiliation of Author(s):计算机学院
Title of Paper:A Test Case Generation Approach Based on Sequence Diagram and Automata Models
Journal:CHINESE JOURNAL OF ELECTRONICS
First Author:Zhang Chen^Duan Zhenhua^Yu Bin^Tian Cong^Ding Ming
Indexed by:Article
Document Code:SCI WOS:000372046100007
Volume:25
Issue:2
Page Number:234-240
ISSN No.:1022-4653
Translation or Not:no
Date of Publication:2016-01-01
Included Journals:SCI