游海龙
个人信息:Personal Information
教授 博士生导师 研究生导师
主要任职:微电子学院 教师
其他任职:西电EDA研究院 副院长
性别:男
毕业院校:西安电子科技大学
学历:博士研究生毕业
学位:博士学位
在职信息:在岗
所在单位:微电子学院
学科:微电子学与固体电子学 管理科学与工程
办公地点:东大楼412B
联系方式:hlyou@mail.xidian.edu.cn
电子邮箱:
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集成电路设计自动化与可靠性设计
集成电路与元器件质量可靠性评价技术
- Machine Learning Based Framework for Fast Resource Estimation of RTL Designs Targeting FPGAs, ACM Transactions on Design Automation of Electronic Systems
- High Quality Hypergraph Partitioning for Logic Emulation;Benzheng Li, Zhongdong Qi, Xiyi He,Zhengguang Tang, Hailong You; INTEGRATION-THE VLSI JOURNAL.INTEGRATION-THE VLSI JOURNAL
- Jinli Zhang, Jinbao Hu, Hailong You, Renxu Jia, Xiaowen Wang, Xiaowen Zhang,A remaining useful life prediction method of IGBT based on online status data,Microelectronics Reliability,Volume 121,2021,114124,ISSN 0026-2714
- B. Li, Q. Du, D. Liu, J. Zhang, G. Chen and H. You, "Placement for Wafer-Scale Deep Learning Accelerator," 2021 26th Asia and South Pacific Design Automation Conference (ASP-DAC), 2021
- Zhang J , Hu J , You H , et al. Characterization method of IGBT comprehensive health index based on online status data[J]. Microelectronics Reliability, 2021, 116(SEP.):114023.
- D. Wu, H. You, X. Wang, S. Zhong and Q. Sun, "Experimental Investigation of Threshold Voltage Temperature Effect During Cross-Temperature Write–Read Operations in 3-D NAND Flash," in IEEE Journal of the Electron Devices Society, vol. 9, pp. 22-26, 2021