游海龙
个人信息:Personal Information
教授 博士生导师 研究生导师
主要任职:微电子学院 教师
其他任职:西电EDA研究院 副院长
性别:男
毕业院校:西安电子科技大学
学历:博士研究生毕业
学位:博士学位
在职信息:在岗
所在单位:微电子学院
学科:微电子学与固体电子学 管理科学与工程
办公地点:东大楼412B
联系方式:hlyou@mail.xidian.edu.cn
电子邮箱:
扫描关注
- [1]Machine Learning Based Framework for Fast Resource Estimation of RTL Designs Targeting FPGAs, ACM Transactions on Design Automation of Electronic Systems
- [2]High Quality Hypergraph Partitioning for Logic Emulation;Benzheng Li, Zhongdong Qi, Xiyi He,Zhengguang Tang, Hailong You; INTEGRATION-THE VLSI JOURNAL.INTEGRATION-THE VLSI JOURNAL
- [3]Jinli Zhang, Jinbao Hu, Hailong You, Renxu Jia, Xiaowen Wang, Xiaowen Zhang,A remaining useful life prediction method of IGBT based on online status data,Microelectronics Reliability,Volume 121,2021,114124,ISSN 0026-2714
- [4]B. Li, Q. Du, D. Liu, J. Zhang, G. Chen and H. You, "Placement for Wafer-Scale Deep Learning Accelerator," 2021 26th Asia and South Pacific Design Automation Conference (ASP-DAC), 2021
- [5]Zhang J , Hu J , You H , et al. Characterization method of IGBT comprehensive health index based on online status data[J]. Microelectronics Reliability, 2021, 116(SEP.):114023.
- [6]D. Wu, H. You, X. Wang, S. Zhong and Q. Sun, "Experimental Investigation of Threshold Voltage Temperature Effect During Cross-Temperature Write–Read Operations in 3-D NAND Flash," in IEEE Journal of the Electron Devices Society, vol. 9, pp. 22-26, 2021
- [7]Lu G , Zhang Z , He F , et al. Performance Improvement of All-Inorganic, Hole-Transport-Layer-Free Perovskite Solar Cells Through Dipoles-Adjustion by Polyethyleneimine Incorporating[J]. IEEE Electron Device Letters, 2021, PP(99):1-1
- [8]F. -C. Liu, C. Li, J. -M. Guo, H. -F. Jiang, H. -L. You and Y. -Q. Zhuang, "A High Sensitivity Biosensor Based On Vertically Stacked Silicon Nanosheet-FET," 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT), 2020
- [9]Zhang J , You H , Jia R . Reliability hazard characterization of wafer-level spatial metrology parameters based on LOF-KNN method[J]. Microelectronics Reliability, 2020, 107:113599
- [10]He F , You H , Li X , et al. Transparent Ultrathin Metal Electrode with Microcavity Configuration for Highly Efficient TCO-Free Perovskite Solar Cells[J]. Materials, 2020, 13(10):2328.
- [11]J. Zhang, H. You and R. Jia, "Reliability hazard characterization of wafer-level spatial metrology parameters based on LOF-KNN method," 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA), 2019
- [12]W. Tian, H. You, C. Zhang, S. Kang, X. Jia and W. K. Chien, "Statistical Process Control for Monitoring the Particles With Excess Zero Counts in Semiconductor Manufacturing," in IEEE Transactions on Semiconductor Manufacturing, vol. 32, no. 1, pp. 93-103, Feb. 2019
- [13]Enhanced Performance of Inverted Non-Fullerene Organic Solar Cells by Using Metal Oxide Electron- and Hole-Selective Layers with Process Temperature ≤150 °C[J]. Polymers, 2018, 10(7):725-.
- [14]You H , Zhang J , Zhang Z , et al. Low Temperature Aqueous Solution-Processed ZnO and Polyethylenimine Ethoxylated Cathode Buffer Bilayer for High Performance Flexible Inverted Organic Solar Cells[J]. Energies, 2017, 10(4):494.
- [15]Two-Level Nested Control Chart for Batch Process in the Semiconductor Manufacturing.IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING.2016,29 (4):399-410
- [16]Efficient flexible inverted small-bandgap organic solar cells with low-temperature zinc oxide interlayer.JAPANESE JOURNAL OF APPLIED PHYSICS.2016,55 (12)
- [17]Yield-Based Capability Index for Evaluating the Performance of Multivariate Manufacturing Process.QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL.2015,31 (3):419-430
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