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基于光腔衰荡法的光学谐振腔损耗测量系统

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Affilication of Author(s):100500

Teaching and Research Group:1105

Patent Coverage:1

Type of Patent:1

Application Number:201110093195.5

Number of Inventors:2

Service Invention or Not:no

Application Date:2011-04-14

Authorization Date:2013-02-27

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