Current position: Home >> Scientific Research >> Patents

测量CCD芯片暗电流和双倍温度常数的方法

Hits:

Affilication of Author(s):物理与光电工程学院

Teaching and Research Group:红外工程系

Patent Coverage:国内

Type of Patent:发明专利

Application Number:201110330695.6

Number of Inventors:10

Service Invention or Not:no

Application Date:2011-10-26

Authorization Date:2014-02-12

Pre One:裸眼3D显示设备的性能指标测试方法及测试系统

Baidu
map