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Affiliation of Author(s):微电子学院

Title of Paper:3脳VDD-tolerant ESD detection circuit in a 90 nm CMOS process

Journal:Xi'an Dianzi Keji Daxue Xuebao/Journal of Xidian University

First Author:Yang, Zhaonian ; Liu, Hongxia ; Zhu, Jia

Document Code:EI 20150700524785

Volume:42

Issue:1

Page Number:56-61 and 20

Translation or Not:no

Date of Publication:2015-01-01

Included Journals:EI