Personal Information:
Associate professor
Paper Publications
- [1]Xinlan Hu, Liang He, Hua Chen, Yunxuan Lv, Haowen Gao, Juncheng Liu.The effect of electric-thermal-vibration stress coupling on the reliability of Sn-Ag-Cu solder joints, Journal of Electronic Materials.Journal of Electronic Materials.2021,51:284-294
- [2]Hao Ni, Liang He, Hua Chen and Xiaofei Jia.Reliability simulation and life prediction of TSV under a thermoelectric coupling field in a 3D integrated circuit.Journal of Electronic Materials.2021,50(6):3592-3602
- [3]Hua Chen, Liang He.The spatial and energy distribution of oxide trap responsible for 1/f noise in 4H-SiC MOSFETs.Journal of Physics Communications.2021,5(3):035002
- [4]程基宽，胡林娜，何亮，郭永刚，宋志成，屈小勇.基于1/f噪声表征研究非晶硅薄膜太阳电池的光致退化机理.太阳能学报.2021,42(5):230-233
- [5]胡林娜，宋志成，何亮等.基于GR噪声的太阳电池缺陷表征研究.太阳能学报.2021,42(3):319-322
- [6]Jiahao Liu, Liang He, Hua Chen, Pan Zhao, Yahui Su, Li Chao, Qin Pan.Reliability simulation and life prediction of Sn63Pb37 BGA solder joint under thermal cycling load.2020 China Semiconductor Technology International Conference(CSTIC 2020).2020
- [7]Liang He, Pan Zhao, Jiahao Liu, Yahui Su, Hua Chen, Xiaofei Jia, Hiroaki Arimura, Jerome Mitard, Liesbet Witters, Naoto Horiguchi, Nadine Collaert, Cor Claeys and Eddy Simoen.Gate metal and cap layer effects on Ge nMOSFETs low-frequency noise behavior.IEEE Transactions on Electron Devices.2019,66(2):1050-1056
- [8]Linna Hu, Liang He, Hua Chen, Xiaofei Jia, Ying Hu, Hongmei Ma, Dandan Guo and Yu Qin.Defect characterizaiton of amorphous silicon thin film solar cell based on low frequency noise.Sci. China Inf. Sci..2018,61(6):069403
- [9]Cor CLaeys, Liang He, Barry O’Sullivan et al..Low frequency noise analysis of impact of metal gate processing on the gate oxide stack quality.ECS Journal of Solid State Science and Technology.2018,7(3):Q26-Q32
- [10]Eddy Simoen, Po-Chun Hsu, Liang He, et al..Do we have to worry about extended defects in high-mobility materials?.Proc. of CSTIC 2018