多应力耦合下电子设备可靠性建模分析与评估技术

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Leading Scientist:苏亚慧

Status:已结题

Supported by:总装备部

Supported by:Other research projects

Project level:National

Project Participants:何亮

Project Number:41402010102

Classification of Disciplines:Engineering

Date of Project Completion:2020-12-31

Date of Project Initiation:2017-01-01

Next One:噪声用于表征InxGa1-xAs鳍式场效应晶体管缺陷性质的研究

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