VLSI互连电迁移失效的多参量表征方法

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Leading Scientist:杜磊

Status:已结题

Supported by:国家自然科学基金委员会

Supported by:National Natural Science Foundation of China (NSFC)

Project level:National

Project Participants:何亮

Project Number:60376023

Classification of Disciplines:Engineering

Date of Project Approval:2004-01-01

Date of Project Completion:2006-12-31

Date of Project Initiation:2004-01-01

Pre One:基于***的电子材料抗辐射能力表征技术

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