Hits:
Affilication of Author(s):微电子学院
Patent Coverage:国内
Type of Patent:发明
Application Number:CN202111120059.0
Authorization number:CN202111120059.0
Service Invention or Not:no
Authorization Date:2021-09-24
Pre One:用于封装后硅通孔叠层芯片的测试结构
Next One:一种多层次融合的三维系统集成结构