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Title of Paper:The Study of the Reliability of Complex Components during the Electromigration Process

Journal:Micromachines

First Author:Hao Cui, Wenchao Tian, Yiming Zhang, Zhiqiang Chen

Indexed by:Journal paper

Discipline:Engineering

First-Level Discipline:Mechanical Engineering

Document Type:J

Volume:14

Issue:3

Page Number:499

Translation or Not:no

Date of Publication:2023-02-21