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Title of Paper:Failure mechanisms and reliability analysis of RF MEMS switches

Journal:Recent Patents on Mechanical Engineering

First Author:Wenchao Tian, Qiang Chao, Zhiqiang Chen

Indexed by:Journal paper

Discipline:Engineering

First-Level Discipline:Mechanical Engineering

Document Type:J

Volume:8

Issue:3

Page Number:201-210

Translation or Not:no

Date of Publication:2015-12-01